Aging test and burn-in socket for TO3P and TO-247-5L components Key benefits - Designed for efficient burn-in and aging tests in production and repair environments: fits TO3P and TO-247-5L packages for fast, repeatable component verification. - Reliable high-temperature performance: construction tolerates elevated temperatures encountered during burn-in cycles. - Gold-plated contacts for corrosion resistance: improves contact stability and long-term antioxidation of electronic components. - 10 A current carrying capacity: suitable for low-power devices and routine functional testing while providing stable electrical performance. - Simple to operate and integrate: easy insertion/removal of parts, making it practical for mass-production lines, repair centers, and electronics development labs. Features - Compatibility: accepts TO3P and TO-247-5L package formats. - Temperature resistance: engineered to withstand burn-in and aging test temperatures. - Contact material: gold plating on test pins/sockets for improved oxidation protection and reliable contact. - Current rating: 10 A maximum continuous current, appropriate for low-power component testing. - Robust construction: stable seating for repeatable test results and reduced contact failure during extended test runs. Typical applications - Mass production burn-in: rapid, repeatable aging tests on TO3P and TO-247-5L components as part of end-of-line quality control. - Repair and service centers: post-repair verification to confirm component stability and functionality before device reassembly. - R&D and prototyping labs: functional aging tests and stress verification during component evaluation and development. Technical notes - Intended for TO3P and TO-247-5L components only; ensure correct orientation and seating during use. - 10 A rating is for low-power testing scenarios; verify system-level requirements before use in higher-power applications. - Gold-plated contacts reduce oxidation risk but follow standard maintenance and cleaning procedures to preserve performance. This socket provides a practical, reliable solution for aging and burn-in testing of TO3P and TO-247-5L devices, improving test repeatability and component longevity without changing original specifications.